Multi-label Dimensionality Reduction (Chapman & Hall/CRC Machine Learning & Pattern Recognition)

Multi-label Dimensionality Reduction (Chapman & Hall/CRC Machine Learning & Pattern Recognition) by Jieping Ye, Liang Sun and Shuiwang Ji

Binding:: Hardcover
Number of Pages:: 400
ISBN:: 1439806152
Product Group:: book
Publisher:: Chapman and Hall/CRC
Publication Date:: Nov. 1, 2010
BooksForGeeks.com ID:: 2922

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